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New modeling of reflection interference contrast microscopy including polarization and numerical aperture effects: application to nanometric distance measurements and object profile reconstruction.
Olivier Theodoly
,
Zen-Hong Huang
,
Marie-Pierre Valignat
Langmuir
, 2010, 26 (3), pp.1940-8.
⟨10.1021/la902504y⟩
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inserm-00440660v1
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